ISBN 9780123538550 is out of print and is currently unavailable, alternate formats (if applicable) are shown below.
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Sem Microcharacterization of Semiconductors: Volume 12 (Out of print)
| PUBLISHER | Academic Press (01/28/1989) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.
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Product Format
Product Details
ISBN-13:
9780123538550
ISBN-10:
0123538556
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
More Product Details
Page Count:
452
Carton Quantity:
18
Product Dimensions:
6.27 x 1.08 x 9.27 inches
Weight:
1.80 pound(s)
Feature Codes:
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Chemical & Biochemical
Technology & Engineering | Mechanical
Technology & Engineering | Chemistry - Industrial & Technical
Dewey Decimal:
621
Descriptions, Reviews, Etc.
publisher marketing
Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.
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Your Price
$72.95